Combined Effects of Heat and PEF on Microbial Inactivation and Quality of Liquid Egg Whites

Wei Zhao, State Key Laboratory of Food Science and Technology, Jiangnan University
Ruijin Yang, State Key Laboratory of Food Science and Technology, Jiangnan University
Yali Tang, State Key Laboratory of Food Science and Technology, Jiangnan University
Rongrong Lu, State Key Laboratory of Food Science and Technology, Jiangnan University

Abstract

Combined effects of heat and pulsed electric fields treatment (20 and 40oC, 0-800 µs at 30 kV/cm) on microbial inactivation inoculated in egg whites were studied. Pulsed electric fields treatment time and processing temperature had profound effects on microbial inactivation. Pulsed electric fields treatment with a bipolar pulse (2 µs wide), an intensity of 30 kV/cm, a frequency of 100 Hz, the processing temperature of 40 oC and treatment time for 800 µs, was sufficient to achieve pasteurization conditions using S. enteritidis , E. coli and S. aureus, common spoilage and pathogenic micro-organisms in egg products. This treatment produced a non-significant (p>0.05) increase in foaming capacity and stability and an increase (p<0.05) in emulsifying capacity and stability. Surface free sulfhydryls and hydrophobicity of egg white proteins increased with the increment of the PEF treatment time due to the partial unfolding of egg white proteins. Almost 50 % of trypsin inhibitory activity of ovomucoid in liquid egg white was decreased when the treatment time extended to 800 µs. These results suggested that combined treatment of heat and pulsed electric fields could be applied to process liquid egg whites to get desired products.

Submitted: June 10, 2007 · Accepted: July 19, 2007 · Published: August 24, 2007

Recommended Citation

Zhao, Wei; Yang, Ruijin; Tang, Yali; and Lu, Rongrong (2007) "Combined Effects of Heat and PEF on Microbial Inactivation and Quality of Liquid Egg Whites," International Journal of Food Engineering: Vol. 3 : Iss. 4, Article 12.
DOI: 10.2202/1556-3758.1256
Available at: http://www.bepress.com/ijfe/vol3/iss4/art12

 
 
 
 

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